Tiphaine Bardon
Awarded VEIV EngD
Imaging-Based Damage Detection in Archives Materials
A state-of-the-art THZ pulsed semiconductor-based imaging system has been developed by Teraview specifically to monitor the thickness, uniformity and density of laminar and coated structures and to identify structural features such as cracks, dislocations and delaminations. Due to its properties, combining a significant depth of penetration into opaque organic materials with a significant amount of chemical information, THZ imaging could significantly improve the present practice of structural and chemical monitoring of heritage objects of organic origin.