Chris Senanayake
Awarded VEIV EngD
This project is concerned with high precision machine-vision inspection systems for detecting foreign or defective bodies/objects on factory conveyor belts. Such systems are sensitive to various external factors such as lighting, dust build ups on the camera lens or slight changes in the colour of the inspected objects, etc. The project will develop new computer vision techniques for reducing sensitivity to such factors by tracking colour distributions over time. We intend to apply established methodologies such as Principal component analysis and model selection in our early studies.